IXSA 10N60B2D1
IXSP 10N60B2D1
Symbol
gfs
TestConditions
Characteristic Values
TO-220 AB (IXSP) Outline
(TJ = 25°C, unless otherwise specified)
min.
typ.
max.
IC = 10A; VCE = 10 V, Note 1
2.0
3.6
S
Cies
Coes
Cres
400
50
pF
pF
pF
VCE = 25 V, VGE = 0 V
f = 1 MHz
11
Qg
17
6
nC
nC
nC
Qge
Qgc
IC = 10A, VGE = 15 V, VCE = 0.5 VCES
7.5
Dim.
Millimeter
Min. Max.
12.70 13.97 0.500 0.550
14.73 16.00 0.580 0.630
Inches
Min. Max.
td(on)
tri
td(off)
tfi
30
30
ns
ns
ns
ns
Inductive load, TJ = 25°C
A
B
C
D
E
F
G
H
J
K
M
N
Q
R
IC = 10A, VGE = 15 V
V
= 0.8 V , RG = 30 Ω
180
165
430
SCwEitching tiCmESes may increase for VCE
(Clamp) > 0.8 • VCES, higher TJ or
increased RG
9.91 10.66 0.390 0.420
3.54
4.08 0.139 0.161
5.85
2.54
6.85 0.230 0.270
3.18 0.100 0.125
Eoff
750 µJ
1.15
2.79
1.65 0.045 0.065
5.84 0.110 0.230
td(on)
tri
30
30
ns
ns
mJ
ns
ns
µJ
0.64
2.54
1.01 0.025 0.040
BSC 0.100
BSC
Inductive load, TJ = 125°C
Eon
td(off)
tfi
0.32
260
270
790
4.32
1.14
4.82 0.170 0.190
1.39 0.045 0.055
IC = 10 A, VGE = 15 V
V
CE = 0.8 VCES, RG = 30 Ω
0.35
2.29
0.56 0.014 0.022
2.79 0.090 0.110
Switching times may increase for
VCE (Clamp) > 0.8 • VCES, higher TJ
or increased RG
Eoff
TO-263 (IXSA) Outline
RthJC
RthCS
1.25 K/W
K/W
TO-220
0.25
Reverse Diode (FRED)
Characteristic Values
(TJ = 25°C, unless otherwise specified)
min. typ. max.
Symbol
VF
TestConditions
IF = 10A, VGE = 0 V
TJ =150°C
1.66
2.66
V
V
A
IRM
trr
IF = 12A, V = 0 V, -diF/dt = 100 A/µs
T = 100°C 1.5
TJJ = 100°C 90
VR = 100 VGE
ns
Dim.
Millimeter
Inches
Min. Max.
Min.
Max.
trr
IF = 1 A; -di/dt = 100 A/µs; VR = 30 V
25
ns
A
4.06
2.03
0.51
1.14
0.46
1.14
4.83
2.79
0.99
1.40
0.74
1.40
.160
.080
.020
.045
.018
.045
.190
.110
.039
.055
.029
.055
A1
RthJC
2.5 K/W
b
b2
c
c2
Note 1: Pulse test, t ≤ 300 µs, duty cycle d ≤ 2 %
D
D1
8.64
7.11
9.65
8.13
.340
.280
.380
.320
E
E1
e
9.65
6.86
2.54
10.29
8.13
BSC
.380
.270
.100
.405
.320
BSC
L
14.61
2.29
1.02
1.27
0
15.88
2.79
1.40
1.78
0.38
.575
.090
.040
.050
0
.625
.110
.055
.070
.015
L1
L2
L3
L4
R
0.46
0.74
.018
.029
IXYS reserves the right to change limits, test conditions, and dimensions.
IXYSMOSFETs andIGBTsarecovered by
oneormoreofthefollowingU.S.patents:
4,835,592
4,850,072
4,881,106
4,931,844
5,017,508
5,034,796
5,049,961
5,063,307
5,187,117
5,237,481
5,381,025
5,486,715
6,162,665
6,259,123B1
6,306,728 B1
6,404,065B1
6,534,343
6,583,505
6,683,344
6,710,405B2
6,710,463
6,727,585