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HYMP564S64LP8-C4

型号:

HYMP564S64LP8-C4

品牌:

HYNIX[ HYNIX SEMICONDUCTOR ]

页数:

14 页

PDF大小:

342 K

64Mx64 bits  
DDR2 SDRAM SO-DIMM  
HYMP564S64(L)P8  
Revision History  
No.  
History  
Date  
Remark  
0.1  
Defined Target Spec.  
July 2004  
This document is a general product description and is subject to change without notice. Hynix Semiconductor does not assume any  
responsibility for use of circuits described. No patent licenses are implied.  
Rev. 0.1 / Jul. 2004  
1
64Mx64 bits  
DDR2 SDRAM SO-DIMM  
HYMP564S64(L)P8  
DESCRIPTION  
Hynix HYMP564S64P8 series is unbuffered 200-pin double data rate 2 Synchronous DRAM Small Outline Dual In-Line Memory Mod-  
ules (DIMMs) which are organized as 64Mx64 high-speed memory arrays. Hynix HYMP564S64P8 series consists of eight 64Mx8  
DDR2 SDRAMs in 60 ball FBGA chipsize packages. Hynix HYMP564S64P8 series provide a high performance 8-byte interface in  
67.60mm X 30.00mm form factor of industry standard. It is suitable for easy interchange and addition.  
Hynix HYMP564S64P8 series is designed for high speed of up to 333MHz and offers fully synchronous operations referenced to both  
rising and falling edges of differential clock inputs. While all addresses and control inputs are latched on the rising edges of the clock,  
Data, Data strobes and Write data masks inputs are sampled on both rising and falling edges of it. The data paths are internally pipe-  
lined and 4-bit prefetched to achieve very high bandwidth. All input and output voltage levels are compatible with SSTL_1.8. High  
speed frequencies, programmable latencies and burst lengths allow variety of device operation in high performance memory system.  
Hynix HYMP564S64P8 series incorporates SPD(serial presence detect). Serial presence detect function is implemented via a serial  
2,048-bit EEPROM. The first 128 bytes of serial PD data are programmed by Hynix to identify DIMM type, capacity and other the  
information of DIMM and the last 128 bytes are available to the customer.  
FEATURES  
512MB (64M x 64) Unbuffered DDR2 SO - DIMM based on  
64Mx8 DDR2 SDRAM  
Fully differential clock operations (CK & /CK) with 200MHz /  
233MHz / 333Hz  
JEDEC standard Double Data Rate2 Synchronous DRAMs  
(DDR2 SDRAMs) with 1.8V +/- 0.1V Power Supply  
Programmable CAS Latency 3 / 4 /5 supported  
Programmable Burst Length 4 / 8 with both sequential and  
interleave mode  
All inputs and outputs are compatible with SSTL_1.8 inter-  
face  
All inputs and outputs SSTL_1.8 compatible  
Auto refresh and self refresh supported  
8192 refresh cycles / 64ms  
OCD (Off-Chip Driver Impedance Adjustment) and ODT  
(On-Die Termination)  
ORDERING INFORMATION  
Type  
Part No.  
Description  
CL-tRCD-tRP  
Form Factor  
HYMP564S64(L)P8-E4  
HYMP564S64(L)P8-E3  
HYMP564S64(L)P8-C5  
HYMP564S64(L)P8-C4  
4-4-4  
3-3-3  
5-5-5  
4-4-4  
PC2-3200 (DDR2-400)  
200pin Unbuffered SO-  
DIMM  
67.60 mm x 30,00 mm  
(MO-224)  
one rank 512MB  
Lead free  
SO-DIMM  
PC2-4300 (DDR2-533)  
This document is a general product description and is subject to change without notice. Hynix Semiconductor does not assume any  
responsibility for use of circuits described. No patent licenses are implied.  
Rev. 0.1 / Jul. 2004  
2
HYMP564S64(L)P8  
PIN DESCRIPTION  
Symbol  
Type Polarity  
Pin Description  
The system clock inputs. All adress an commands lines are sampled on the cross point of the  
rising edge of CK and falling edge of CK. A Delay Locked Loop(DLL) circuit is driven from the  
clock inputs and output timing for read operations is synchronized to the input clock.  
CK[1:0],  
CK[1:0]  
Cross  
Point  
Input  
Input  
Input  
Active  
High  
Activates the DDR2 SDRAM CK signal when high and deactivates the CK signal when low. By  
deactivating the clocks, CKE low initiates the Power Down mode or the Self Refresh mode.  
CKE[1:0]  
Enables the associated DDR2 SDRAM command decoder when low and disables the command  
decoder when high. When the command decoder is disabled, new commands are ignored but  
previous operations continue. Rank 0 is selected by S0; Rank 1 is selected by S1  
Active  
Low  
/S[1:0]  
/RAS, /CAS, /  
WE  
Active  
Low  
When sampled at the cross point of the rising edge of CK and falling edge of CK, CAS, RAS and  
WE define the operation to be excecuted by the SDRAM.  
Input  
Input  
Input  
BA[1:0]  
Selects which DDR2 SDRAM internal bank of four or eight is activated.  
Active  
High  
Asserts on-die termination for DQ, DM, DQS and DQS signals if enabled via the DDR2 SDRAM  
mode register.  
ODT{1:0]  
During a Bank Activate command cycle, difines the row address when sampled at the cross  
point of the rising edge of CK and falling edge of CK. During a Read or Write command cycle,  
defines the column address when sampled at the cross point of the rising edge of CK and fall-  
ing edge of CK. In addition to the column address, AP is used to invoke autoprecharge opera-  
tion at the end of the burst read or write cycle. If AP is high., autoprecharge is selected and  
BA0-BAn defines the bank to be precharged. If AP is low, autoprecharge is disabled. During a  
Precharge command cycle., AP is used in conjunction with BA0-BAn to control which bank(s) to  
precharge. If AP is high, all banks will be precharged regardless of the state of BA0-BAn  
inputs. If AP is low, then BA0-BAn are used to define which bank to precharge.  
A[9:0], A10/AP,  
A[15:11]  
Input  
DQ[63:0]  
DM[7:0]  
In/Out  
Input  
Data Input/Output pins.  
The data write masks, associated with one data byte. In Write mode, DM operates as a byte  
mask by allowing input data to be written if it is low but blocks the write operation if it is high.  
In Read mode, DM lines have no effect.  
Active  
High  
The data strobe, associated with one data byte, sourced whit data transfers. In Write mode,  
the data strobe is sourced by the controller and is centered in the data window. In Read  
mode, the data strobe is sourced by the DDR2 SDRAMs and is sent at leading edge of the data  
window. DQS signals are complements, and timing is relative to the crosspoint of respective  
DQS and DQS. If the module is to be operated in single ended strobe mode, all DQS signals  
must be tied on the system board to VSS and DDR2 SDRAM mode registers programmed  
approriately.  
DQS[7:0],  
DQS[7:0]  
Cross  
point  
In/Out  
VDD  
VDDSPD,VSS  
,
Supply  
In/Out  
Power supplies for core, I/O, Serial Presense Detect, and ground for the module.  
This is a bidirectional pin used to transfer data into or out of the SPD EEPROM. A resister must  
be connected to VDD to act as a pull up.  
SDA  
This signals is used to clock data into and out of the SPD EEPROM. A resistor may be con-  
nected from SCL to VDD to act as a pull up.  
SCL  
Input  
Input  
In/Out  
SA[1:0]  
TEST  
Address pins used to select the Serial Presence Detect base address.  
The TEST pin is reserved for bus analysis tools and is not connected on normal memory mod-  
ules(SODIMMs).  
Rev. 0.1 / Jul. 2004  
3
HYMP564S64(L)P8  
PIN ASSIGNMENT  
Back  
Side  
Front  
Side  
Front  
Side  
Back  
Side  
Pin  
NO.  
Front  
Side  
Pin  
NO.  
Back  
Side  
Pin  
NO.  
Front  
Side  
Pin  
NO.  
Pin  
NO.  
Pin  
NO.  
Back  
Side  
Pin  
NO.  
Pin NO.  
151  
153  
155  
157  
159  
161  
163  
165  
167  
169  
171  
173  
175  
177  
179  
181  
183  
185  
187  
189  
191  
193  
195  
197  
199  
1
VREF  
VSS  
2
VSS  
DQ4  
DQ5  
VSS  
DM0  
VSS  
DQ6  
DQ7  
VSS  
DQ12  
DQ13  
VSS  
DM1  
VSS  
CK0  
51  
53  
55  
57  
59  
61  
63  
65  
67  
69  
71  
73  
75  
77  
79  
81  
83  
85  
87  
89  
91  
93  
95  
97  
99  
DQS2  
VSS  
DQ18  
DQ19  
VSS  
DQ24  
DQ25  
VSS  
DM3  
NC  
52  
54  
56  
58  
60  
62  
64  
66  
68  
70  
72  
74  
76  
78  
80  
82  
84  
86  
88  
90  
92  
94  
96  
98  
100  
DM2  
VSS  
101  
103  
105  
107  
109  
111  
113  
115  
117  
A1  
VDD  
A10/AP  
BA0  
102  
104  
106  
108  
110  
112  
114  
116  
118  
120  
122  
124  
126  
128  
130  
132  
134  
136  
138  
140  
142  
144  
146  
148  
150  
A0  
DQ42  
DQ43  
VSS  
152  
154  
156  
158  
160  
162  
DQ46  
DQ47  
VSS  
3
4
VDD  
BA1  
5
DQ0  
DQ1  
VSS  
6
DQ22  
DQ23  
VSS  
7
8
RAS  
S0  
DQ48  
DQ49  
VSS  
DQ52  
DQ53  
VSS  
9
10  
12  
14  
16  
18  
20  
22  
24  
26  
28  
30  
32  
34  
36  
38  
40  
42  
44  
46  
48  
50  
WE  
11  
13  
15  
17  
19  
21  
23  
25  
27  
29  
31  
33  
35  
37  
39  
41  
43  
45  
47  
49  
DQS0  
DQS0  
VSS  
DQ28  
DQ29  
VSS  
VDD  
CAS  
VDD  
ODT0  
A13  
NC,TEST 164  
CK1  
NC/S1  
VDD  
VSS  
DQS6  
DQS6  
VSS  
166  
168  
170  
172  
174  
176  
178  
180  
182  
184  
186  
188  
190  
192  
194  
196  
198  
CK1  
DQ2  
DQ3  
VSS  
DQS3  
DQS3  
VSS  
VDD  
NC  
VSS  
119 NC/ODT1  
DM6  
VSS  
VSS  
DQ26  
DQ27  
VSS  
CKE0  
VDD  
NC  
121  
123  
125  
127  
VSS  
DQ32  
DQ33  
VSS  
VSS  
DQ36  
DQ37  
VSS  
DM4  
VSS  
DQ38  
DQ39  
VSS  
DQ34  
DQ45  
VSS  
DQS5  
DQS5  
VSS  
DQ8  
DQ9  
VSS  
DQ30  
DQ31  
VSS  
DQ50  
DQ51  
VSS  
DQ54  
DQ55  
VSS  
DQS1  
DQS1  
VSS  
NC/CKE1 129  
DQS4  
DQS4  
VSS  
DQ56  
DQ57  
VSS  
DQ60  
DQ61  
VSS  
CK0  
VDD  
NC/A15  
NC/A14  
VDD  
A11  
131  
133  
135  
137  
139  
141  
143  
145  
147  
149  
VSS  
DQ14  
DQ15  
VSS  
VSS  
DQ20  
DQ21  
VSS  
NC  
DQ10  
NC  
BA2  
VDD  
A12  
DQ34  
DQ35  
VSS  
DM7  
DQS7  
DQS7  
VSS  
VSS  
VSS  
DQ58  
DQ59  
VSS  
VSS  
A9  
A7  
DQ40  
DQ41  
VSS  
DQ62  
DQ63  
VSS  
DQ16  
DQ17  
VSS  
A8  
A6  
VDD  
A5  
VDD  
A4  
SDA  
DM5  
SCL  
SA0  
DQS2  
A3  
A2  
VSS  
VDDSPD 200  
SA1  
Pin Location  
200  
42  
2
40  
Back  
Front  
1
199  
39  
41  
Rev. 0.1 / Jul. 2004  
4
HYMP564S64(L)P8  
FUNCTIONAL BLOCK DIAGRAM  
N.C.  
N.C.  
N.C.  
/S1  
ODT1  
CKE1  
3Ω+/− 5%  
CKE0  
ODT0  
DQS0  
DQS0  
/DQS0  
DM0  
DQS  
/DQS  
DM  
DQS4  
/DQS4  
DM4  
DQS  
/CS ODT CKE  
/CS ODT CKE  
/DQS  
DM  
I/O 0  
I/O 1  
I/O 2  
I/O 3  
I/O 4  
I/O 5  
I/O 0  
DQ0  
DQ32  
DQ33  
DQ34  
DQ35  
DQ36  
D0  
D4  
I/O 1  
DQ1  
DQ2  
DQ3  
DQ4  
DQ5  
DQ6  
DQ7  
I/O 2  
I/O 3  
I/O 4  
I/O 5  
DQ37  
DQ38  
DQ39  
I/O 6  
I/O 7  
I/O 6  
I/O 7  
DQS1  
/DQS1  
DM1  
DQS5  
/DQS5  
DM5  
DQS  
/DQS  
DM  
DQS  
/DQS  
DM  
/CS ODT CKE  
/CS ODT CKE  
I/O 0  
I/O 1  
I/O 2  
I/O 3  
I/O 4  
I/O 5  
I/O 0  
I/O 1  
I/O 2  
I/O 3  
I/O 4  
I/O 5  
DQ8  
DQ8  
DQ40  
DQ41  
DQ42  
DQ43  
DQ44  
DQ45  
DQ46  
DQ47  
D1  
D5  
DQ10  
DQ11  
DQ12  
DQ13  
DQ14  
DQ15  
I/O 6  
I/O 7  
I/O 6  
I/O 7  
DQS2  
/DQS2  
DM2  
DQS6  
/DQS6  
DM6  
DQS  
/DQS  
DM  
DQS  
/DQS  
DM  
/CS ODT CKE  
/CS ODT CKE  
I/O 0  
I/O 1  
I/O 2  
I/O 3  
I/O 4  
I/O 5  
I/O 0  
I/O 1  
I/O 2  
I/O 3  
I/O 4  
I/O 5  
DQ16  
DQ17  
DQ18  
DQ19  
DQ20  
DQ21  
DQ22  
DQ23  
DQ48  
DQ49  
DQ50  
DQ51  
DQ52  
DQ53  
DQ54  
DQ55  
D2  
D6  
I/O 6  
I/O 7  
I/O 6  
I/O 7  
DQS3  
/DQS3  
DM3  
DQS0  
/DQS0  
DM0  
DQS  
/DQS  
DM  
DQS  
/DQS  
DM  
/CS ODT CKE  
/CS ODT CKE  
I/O 0  
I/O 1  
I/O 2  
I/O 3  
I/O 4  
I/O 5  
I/O 0  
I/O 1  
I/O 2  
I/O 3  
I/O 4  
I/O 5  
DQ24  
DQ25  
DQ26  
DQ27  
DQ28  
DQ29  
DQ30  
DQ31  
DQ56  
DQ57  
DQ58  
DQ59  
DQ60  
DQ61  
DQ62  
DQ63  
D3  
D7  
I/O 6  
I/O 7  
I/O 6  
I/O 7  
SCL  
SCL  
A0  
A1  
A2  
3Ω  
+/- 5%  
SDA  
SDA  
SA0  
SA1  
Serial PD  
WP  
BA0-BA2  
A0-AN  
/RAS  
/CAS  
/WE  
SDRAMS D0-7  
SDRAMS D0-7  
SDRAMS D0-7  
SDRAMS D0-7  
SDRAMS D0-7  
Notes :  
1. Unless otherwise noted, resistor values are 22  
? 5%  
2. DQ wring may differ form that described in this drawing; however ,  
DQ,DM,DQS,/DQS relationships are maintained as shown.  
CK0  
VDD SPD  
VREF  
Serial PD  
4 loads  
/CK0  
SDRAMS DO-D7  
CK1  
VDD  
SDRAMS DO-D7, VDD and VDD  
Q
4 loads  
/CK1  
SDRAMS DO-D7, SPD  
VSS  
Rev. 0.1 / Jul. 2004  
5
HYMP564S64(L)P8  
ABSOLUTE MAXIMUM RATINGS  
Parameter  
Symbol  
Value  
-0.5 ~ +2.3  
Unit  
Note  
oC  
Voltage on any pin relative to VSS  
Supply voltage relative to VSS  
Short circuit output current  
VT  
1
1,2  
1
V
VDD,VDDQ  
VIN, VOUT  
TOPR  
-0.5 ~ +2.3  
-0.5 ~ +2.3  
0 ~ +65  
V
oC  
oC  
Operating ambient temperature  
1
TSTG  
Storage Temperature  
-55 ~ +100  
1
Note :  
1.Stresses greater than those listed under “ Absolute Maximum Ratings” may cause permanent damage to the device. Exposure to  
absolute maximum reating conditions for extended periods may affect reliability.  
2. Under all conditions VDDQ must be less than or equal to VDD.  
DC OPERATING CONDITIONS (SSTL_1.8)  
Parameter  
Symbol  
Min  
Typ.  
Max  
Unit  
Note  
VDD  
1.7  
1.7  
1.8  
1.9  
1.9  
V
V
V
V
V
V
Power Supply Voltage  
VDDQ  
1.8  
Input Reference Voltage  
EEPROM Supply Voltage  
Input High Voltage  
VREF  
0.49 x VDDQ  
1.7  
0.5 x VDDQ  
0.51 x VDDQ  
3.6  
1
VDDSPD  
VIH(DC)  
VIL(DC)  
-
-
-
VREF + 0.125  
-0.30  
VDDQ + 0.3  
VREF - 0.125  
Input Low Voltage  
Note :  
1. Peak to peak ac noise on VREF may not exeed +/-2% VREF(dc)  
AC OPERATING CONDITIONS (SSTL_1.8)  
Parameter  
Symbol  
Min  
Max  
Unit  
Note  
VIH(AC)  
VIL(AC)  
VID(AC)  
Input High (Logic 1) Voltage, DQ, DQS and DM signals  
Input Low (Logic 0) Voltage, DQ, DQS and DM signals  
ac differential input voltage  
VREF + 0.250  
-
V
V
V
-
VREF - 0.250  
VREF + 0.250  
-
1
2
0.5*VDDQ-  
0.175  
0.5*VDDQ-  
0.175  
VIX(AC)  
ac differential cross point voltage  
V
Note :  
1. VID specifies the input differential voltage I VTR-VCP I required for switching, where VTR is the true input signal (such as CK,  
DQS, LDQS or UDQS) and VCP is the complementary input signal(such as /CK, /DQS,/LDQS or /UDQS). The magnitude value is  
equal to VIH(AC) - VIL(AC).  
2. The typical value of VIX(AC) is expected to about 0.5*V DDQ of the transmitting device and VIX(AC) is expected to track variations  
in VDDQ. VIX(AC) indicates the voltage at which differential input signals must cross.  
Rev. 0.1 / Jul. 2004  
6
HYMP564S64(L)P8  
DC CHARACTERISTICS I  
HYMP564S64(L)P8  
PC2 3200  
max.  
640  
PC2 4300  
max.  
720  
PC2 5300  
Parameter  
Operating Current  
Operating Current  
Symbol  
IDD0  
max.  
800  
Unit Note  
mA  
mA  
720  
800  
880  
IDD1  
Precharge Power Down  
Standby Current  
IDD2P  
IDD2F  
IDD3P  
24  
32  
40  
mA  
mA  
mA  
280  
120  
320  
160  
400  
200  
Idle Standby Current  
Active Power Down  
Standby Current  
Active Standby Current  
Operating Current  
IDD3N  
IDD4R  
IDD4W  
IDD5  
440  
1040  
1040  
1280  
40  
520  
1120  
1120  
1280  
40  
600  
1240  
1240  
1280  
40  
mA  
mA  
mA  
mA  
mA  
mA  
Operating Current  
Auto Refresh Current  
IDD6  
Self Refresh Current  
IDD6(L)  
24  
24  
24  
Operating Current - Four  
Bank Operation  
1680  
1840  
2000  
mA  
IDD7  
DC CHARACTERISTICS II  
(DDR2 SDRAM Component Specification)  
Parameter  
Symbol  
Value  
Unit  
Note  
Output High Voltage; Minimum required Output pull-up under  
AC test load  
VOH  
VOL  
VTT + 0.603  
V
Output Low Voltage ; Maximum required Output pull-down  
dunder AC test load  
VTT-0.603  
V
Output timing measurement reference level  
Output minimum sink DC current  
VOTR  
IOL  
0.5 x VDDQ  
+13.4  
V
1
2, 4, 5  
mA  
Output minimum source DC current  
IOH  
-13.4  
3, 4, 5  
mA  
Note:  
1. The VDDQ of the device under test is referenced.  
2.  
V
DDQ = 1.7 V; VOUT = 1420 mV. (VOUT - VDDQ)/IOH must be less than 21 ohm for values of VOUT between VDDQ and VDDQ  
280 mV.  
DDQ = 1.7 V; VOUT = 280 mV. VOUT/IOL must be less than 21 ohm for values of VOUT between 0 V and 280 mV.  
-
3.  
V
4. The dc value of VREF applied to the receiving device is set to VTT.  
5. The values of IOH(dc) and IOL(dc) are based on the conditions given in Notes 1 and 2. They are used to test device drive current  
capability to ensure VIH min plus a noise margin and VIL max minus a noise margin are delivered to an SSTL_18 receiver. The  
actual current values are derived by shifting the desired driver operating point (see Section 3.3) along a 21 ohm load line to  
define a convenient driver current for measurement.  
Rev. 0.1 / Jul. 2004  
7
HYMP564S64(L)P8  
IDD Measurement Condition (VDD= 1.8 ± 0.1V, VDDQ= 1.8 ± 0.1V)  
Parameter  
Symbol  
Test Condition  
Operating Current - One bank Active - Precharge ;  
tRC=tRC(min); tCK= tCK(min), tRAS = tRASmin ; DQ,DM and DQS inputs changing twice  
per clock cycles ; address and control inputs changing once per clock cycle  
Operating Current  
(ACT-PRE)  
IDD0  
One bank ; Active - Read - Precharge ; Burst Length = 4 ; tRC=tRC(min); tCK= tCK(min) ;  
IOUT= 0mA; address and control inputs changing once per clock cycle  
Operating Current  
(ACT-READ-PRE)  
IDD1  
IDD2P  
IDD2N  
Idle power-down standby  
current  
All banks idle ; Power down mode ; CKE=VIL(max), tCK= tCK(min)  
/CS = VIH(min), All banks idle ; tCK= tCK(min) ; CKE = VIH(min) ; address and control inputs  
changing once per clock cycle. VIN = VREF for DQ, DQS and DM  
Idle standby current  
Active power-down  
standby current  
IDD3P  
IDD3N  
One bank active ; Power down mode ; CKE= Low, tCK= tCK(min)  
/CS= HIGH; CKE = HIGH; One bank; Active-Precharge; tRC = tRAS(max); tCK = t CK  
(max); DQ, DM and DQS inputs changing twice per clock cycle; Address and other control  
inputs changing once per clock cycle  
Active standby current  
(Burst read operating)  
Burst = 4 ; Reads; Continuous burst; One bank active; Address and control inputs changing  
once per clock cycle; tCK= tCK (min); IOUT = 0mA  
Operating current  
(Burst read operating)  
IDD4R  
IDD4W  
Burst = 4; Writes; Continuous burst; Address and control inputs changing once per clock  
cycle; tCK = tCK (min); DQ, DM, and DQS inputs changing twice per clock cycle  
Operating current  
(Burst write operating)  
Auto-refresh current  
Self-refresh current  
IDD5  
IDD6  
tRC = tRFC(min)  
Self-Refresh Mode: CKE =< 0.2V; External clock on; tCK = tCK(min)  
Operating Bank Interleave Read Current:  
Four bank interleaving Reads with BL=4 Refer to the following page for detailed test  
condition  
Operating current  
(Bank interleaving)  
IDD7  
Address and control inputs change during Active, READ or WRITE commands.  
PIN CAPACITANCE (TA=25 oC, f=100MHz )  
Parameter  
Pin  
A0 ~ A12, BA0, BA1  
Symbol  
Min  
Max  
Unit  
Input Capacitance  
CIN1  
CIN2  
CIN3  
CIN4  
CIN5  
CIN6  
CIO1  
27  
27  
28  
29  
15  
5
44  
40  
41  
42  
23  
8
pF  
pF  
pF  
pF  
pF  
pF  
pF  
Input Capacitance  
/RAS, /CAS, /WE  
CKE0, CKE1  
/S0, /S1  
Input Capacitance  
Input Capacitance  
Input Capacitance  
CK0, /CK0, CK1, /CK1  
DM0 ~ DM7  
Input Capacitance  
Data Input / Output Capacitance  
DQ0 ~ DQ63, DQS0 ~ DQS6  
5
8
Note :  
1. VDD = min. to max., VDDQ = 1.7V to 1.9V, VODC = VDDQ/2, VOpeak-to-peak = 0.2V  
2. Pins not under test are tied to GND.  
3. These value are guaranteed by design and tested on a sample basis only.  
Rev. 0.1 / Jul. 2004  
8
HYMP564S64(L)P8  
AC CHARACTERISTICS (AC operating conditions unless otherwise noted)  
DDR2 400 -E3 , E4  
DDR2 533 -C4 , C5  
Unit Note  
Parameter  
Symbol  
Min  
3(4)  
Max  
5
Min  
Max  
CAS Latency  
CL  
tRCD  
tRP  
4(5)  
5
ns  
ns  
ns  
ns  
ps  
Row Address to Column Address Delay  
Row Precharge Time  
15(20)  
15(20)  
60(65)  
-600  
-
15(20)  
15(20)  
60(65)  
-600  
-
-
-
Row Cycle Time  
tRC  
-
-
Data-Out edge to Clock edge Skew  
DQS-Out edge to Clock edge Skew  
Clock High Level Width  
tAC  
600  
0.55  
0.55  
0.55  
600  
0.55  
0.55  
0.55  
tDQSCK  
tCH  
-0.55  
0.45  
-0.55  
0.45  
ns  
CK  
CK  
Clock Low Level Width  
tCL  
0.45  
0.45  
min  
(tCL,tCH)  
min  
(tCL,tCH)  
Clock Half Period  
tHP  
-
-
ns  
System Clock Cycle Time  
DQ and DM input hold time  
DQ and DM input setup time  
Input Pulse Width  
tCK  
tDH  
tDS  
5000  
400  
400  
2.2  
8000  
3750  
400  
400  
2.2  
8000  
ps  
ps  
ps  
ns  
-
-
-
-
1
1
tIPW  
Data-out high-impedance window from CK, /  
CK  
tHZ  
tLZ  
tAC(Max)  
tAC(Max)  
tAC(Max)  
tAC(Max)  
ps  
ps  
Data-out low-impedance window from CK, /  
CK  
tAC(min)  
tAC(min)  
DQS-Out edge to Data-Out edge Skew  
Data Hold Skew Factor  
tDQSQ  
tQHS  
-
-
0.4  
0.5  
-
-
0.4  
0.5  
ps  
ps  
tHP  
-tQHS  
tHP  
-tQHS  
Data-Out hold time from DQS  
tQH  
-
-
ps  
Clock to First Rising edge of DQS-In  
Write DQS High Level Width  
Write DQS Low Level Width  
DQS falling edge to CK setup time  
DQS falling edge hold time from CK  
Mode Register Set Delay  
tDQSS  
tDQSH  
tDQSL  
tDSS  
WL-0.25  
0.35  
0.35  
0.2  
WL+0.25  
WL-0.25  
0.35  
0.35  
0.2  
WL+0.25  
tCK  
tCK  
tCK  
tCK  
tCK  
tCK  
tCK  
tCK  
tCK  
-
-
-
-
-
-
-
-
tDSH  
0.2  
0.2  
tMRD  
2
-
2
-
Write DQS Preamble Setup Time  
Write DQS Postamble Time  
tWPRES  
tWPST  
tRPRE  
0
-
0
-
0.4  
0.6  
1.1  
0.4  
0.6  
1.1  
Read DQS Preamble Time  
0.9  
0.9  
Rev. 0.1 / Jul. 2004  
9
HYMP564S64(L)P8  
AC CHARACTERISTICS (AC operating conditions unless otherwise noted)  
- continued -  
DDR2 400 -E3 , E4  
DDR2 533 -C4 , C5  
Unit Note  
Parameter  
Symbol  
Min  
600  
Max  
Min  
Max  
Input Hold Time (fast slew rate)  
Input Setup Time (fast slew rate)  
Read Preamble  
tIH  
tIS  
-
500  
-
ps  
ps  
1
1
600  
-
500  
-
tRPRE  
tRPST  
tRAS  
tRAP  
tRRD  
tWR  
0.9  
1.1  
0.9  
1.1  
tCK  
tCK  
ns  
Read Postamble  
0.4  
0.6  
0.4  
0.6  
Row Active Time  
45  
-
-
-
-
45  
-
-
-
-
Active to Read with Auto Precharge Delay  
Row Active to Row Active Delay  
Write Recovery Time  
tRCDmin  
7.5  
tRCDmin  
7.5  
ns  
ns  
15  
15  
ns  
(tWR/tCK)  
+
(tRP/tCK)  
(tWR/tCK)  
+
(tRP/tCK)  
Auto Precharge Write Recovery +  
Precharge Time  
tDAL  
-
-
tCK  
Write to Read Command Delay  
tWTR  
tXSC  
10  
200  
2
-
-
-
7.5  
200  
2
-
-
-
ns  
Exit Self Refresh to Any Execute Command  
tCK  
tCK  
Exit power down to any non-read command tXPNR  
Exit precharge power down to read  
command  
tXPRD  
6-AL  
2
-
-
-
6-AL  
2
-
-
-
tCK  
tCK  
tCK  
Exit active power down to read command  
tXARD  
Exit active power down to read command  
(slow exit/low power mode)  
tXARDS  
6-AL  
6-AL  
Output impedance test driver delay  
Auto Refresh Row Cycle Time  
Average Periodic Refresh Interval  
tOIT  
tRFC  
tREFI  
0
105  
-
12  
-
0
105  
-
12  
-
ns  
ns  
us  
7.8  
7.8  
Note :  
1. Timing definition and values For these parameters may change due to JEDEC work. This may also effect the Serial PD code for  
these parameters.  
2. For details and notes, please refer to the relevant HYNIX component datasheet.  
Rev. 0.1 / Jul. 2004  
10  
HYMP564S64(L)P8  
PACKAGE OUTLINE  
Front  
67.60  
20.00 Min  
Side  
tbd max  
4.00 +/-0.10  
30.00  
(Front)  
20.00  
PIN  
1
PIN  
41  
PIN  
39  
PIN  
199  
1.00 ± 0.10  
11.40  
2.70  
4.20  
Back  
47.40  
2.45  
11.40  
2.40  
4.20  
PIN  
40  
PIN  
42  
PIN  
200  
PIN  
2
note:  
1. all dimension Units are millimeters.  
2. all outline dimensions and tolerances match up to the JEDEC standard.  
Rev. 0.1 / Jul. 2004  
11  
SERIAL PRESENCE DETECT  
SPD SPECIFICATION  
(64Mx64 Unbuffered Lead free DDR2 SO-DIMM)  
Rev. 0.1 / Jul. 2004  
12  
HYMP564S64(L)P8  
SERIAL PRESENCE DETECT  
BinSort: E3(DDR24003-3-3),E4(DDR2400 4-4-4),  
C4(DDR2 533 4-4-4), C5(DDR2 533 5-5-5)  
Speed  
Grade  
Hexa  
Value  
Byte#  
Function Description  
Function Supported  
Note  
0
1
2
3
4
5
6
7
8
Number of bytes utilized by module manufacturer  
Total number of Bytes in SPD device  
Fundamental memory type  
Number of row address on this assembly  
Number of column address on this assembly  
Number of DIMM ranks  
Module data width  
Module data width (continued)  
Voltage Interface level of this assembly  
all  
all  
all  
all  
all  
all  
all  
all  
all  
E3,E4  
C4,C5  
E3,E4  
C4,C5  
all  
all  
all  
128 Bytes  
256 Bytes  
DDR2 SDRAM  
80  
08  
08  
0E  
0A  
60  
40  
00  
05  
50  
3D  
60  
50  
00  
82  
08  
00  
00  
0C  
04  
38  
00  
04  
00  
00  
14  
10  
1 rank  
64 Bits  
1
1
-
SSTL 1.8V  
5.0 ns  
3.75 ns  
+/-0.6ns  
2
2
9
DDR SDRAM cycle time at CL=5  
10  
DDR SDRAM access time from clock (tAC)  
+/-0.5ns  
non-ECC  
7.8us & Self refresh  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
DIMM Configuration type  
Refresh Rate and Type  
Primary DDR SDRAM width  
Error Checking DDR SDRAM data width  
Reserved  
Burst Lengths Supported  
Number of banks on each SDRAM Device  
CAS latency supported  
Reserved  
DIMM Type  
DDR SDRAM module attributes  
DDR SDRAM device attributes : General  
x8  
None  
-
4,8  
4
3, 4, 5  
-
SO-DIMM  
Normal  
-
all  
all  
all  
all  
all  
all  
all  
E3,E4,C  
5
C4  
5.0ns  
3.75ns  
50  
3D  
60  
23  
DDR SDRAM cycle time at CL=4(tCK)  
2
2
E3,E4,C  
+/-0.6ns  
24  
DDR SDRAM access time from clock at CL=4(tAC)  
5
C4  
+/-0.5ns  
5.0ns  
Undefined  
+/-0.6ns  
Undefined  
15ns  
20ns  
18.75ns  
7.5ns  
15ns  
20ns  
18.75ns  
45ns  
512MB  
0.6ns  
0.5ns  
0.6ns  
0.5ns  
0.40ns  
0.35ns  
0.40ns  
0.35ns  
15ns  
10ns  
7.5ns  
50  
50  
00  
60  
00  
3C  
50  
4B  
1E  
3C  
50  
4B  
2D  
80  
60  
50  
60  
50  
40  
35  
40  
35  
3C  
28  
1E  
1E  
00  
00  
3C  
41  
3F  
E3,C4  
E4,C5  
E3,C4  
E4,C5  
E3, C4  
E4  
C5  
all  
E3, C4  
E4  
C5  
25  
26  
DDR SDRAM cycle time at CL=3(tCK)  
2
2
DDR SDRAM access time from clock at CL=3(tAC)  
27  
28  
29  
Minimum Row Precharge Time(tRP)  
Minimum Row Activate to Row Active delay(tRRD)  
Minimum RAS to CAS delay(tRCD)  
30  
31  
Minimum active to precharge time(tRAS)  
Module rank density  
all  
all  
E3, E4  
C4, C5  
E3, E4  
C4, C5  
E3, E4  
C4, C5  
E3, E4  
C4, C5  
all  
32  
33  
34  
Address and command input setup time before clock (tIS)  
Address and command input hold time after clock (tIH)  
Data input setup time before clock (tDS)  
35  
36  
37  
Data input hold time after clock (tDH)  
Write recovery time(tWR)  
E3, E4  
C4, C5  
all  
Internal write to read command delay(tWTR)  
38  
39  
40  
Internal read to precharge command delay(tRTP)  
Memory analysis probe characteristics  
Extension of byte 41 tRC and byte 42 tRFC  
7.5ns  
Undefined  
Undefined  
60ns  
65ns  
63.75ns  
all  
E3,C4  
E4  
41  
Minimum active / auto-refresh time ( tRC)  
C5  
Rev. 0.1 / Jul. 2004  
13  
HYMP564S64(L)P8  
- continued -  
Speed  
Grade  
Hexa  
Value  
Byte#  
Function Description  
Function Supported  
Note  
Minimum auto-refresh to active/auto-refresh  
command period(tRFC)  
Maximum cycle time (tCK max)  
42  
43  
44  
all  
105ns  
69  
all  
8.0ns  
0.35ns  
0.30ns  
0.45ns  
0.40ns  
No PLL  
Undefined  
80  
23  
1E  
2D  
28  
00  
00  
10  
BD  
3A  
2D  
11  
AD  
00  
0*  
1*  
2*  
3*  
4*  
5*  
48  
59  
4D  
50  
35  
36  
34  
53  
36  
34  
50  
38  
2D  
45  
43  
33  
34  
35  
20  
E3, E4  
C4, C5  
E3, E4  
C4, C5  
Maximim DQS-DQ skew time(tDQSQ)  
45  
46  
Maximum read data hold skew factor(tQHS)  
PLL Relock time  
47~61 Superset information(may be used in future)  
62  
63  
64  
SPD Revision code  
1.0  
-
-
-
E3  
E4  
C4  
C5  
Checksum for Bytes 0~62  
Manufacturer JEDEC ID Code  
-
Hynix JEDEC ID  
65~71 --------- Manufacturer JEDEC ID Code  
-
Hynix(Korea Area)  
HSA(United States Area)  
HSE(Europe Area)  
HSJ(Japan Area)  
72  
Manufacturing location  
6
Singapore  
Asia Area  
73  
74  
75  
76  
77  
78  
79  
80  
81  
82  
83  
84  
85  
Manufacture part number(Hynix Memory Module)  
-------- Manufacture part number(Hynix Memory Module)  
-------- Manufacture part number(Hynix Memory Module)  
Manufacture part number (DDR2 SDRAM)  
---------Manufacture part number(Memory density)  
Manufacture part number(Module Depth)  
------- Manufacture part number(Module Depth)  
Manufacture part number(Module type)  
Manufacture part number(Data width)  
-------Manufacture part number(Data width)  
Manufacture part number(Package material)  
Manufacture part number(Component configuration)  
Manufacture part number(Hyphen)  
H
Y
M
P
5
6
4
S
6
4
P
8
‘-’  
E
C
3
4
5
E3, E4  
C4, C5  
E3  
E4,C4  
C5  
86  
Manufacture part number(Minimum cycle time)  
87  
-------Manufacture part number(Minimum cycle time)  
88~90 Manufacture part number(T.B.D)  
Blank  
91  
92  
93  
94  
Manufacture revision code(for Component)  
Manufacture revision code (for PCB)  
Manufacturing date(Year)  
3
3
4
5
5
Manufacturing date(Week)  
95~98 Module serial number  
99~127 Manufacturer specific data (may be used in future)  
128~255 Open for customer use  
Undefined  
Undefined  
00  
00  
Note :  
1. The bank address is excluded  
2. This value is based on the component specification  
3. These bytes are programmed by code of date week & date year  
4. These bytes apply to Hynix’s own Module Serial Number System  
5. These bytes undefined and coded as ‘00h’  
6. Refer to Hynix Web Site  
Byte 83~84, Low Power Part  
Speed  
Grade  
Hexa  
Value  
Byte #  
Function Description  
Function Supported  
Note  
83  
84  
Manufacture part number(Low power part)  
Manufacture part number(Package material)  
L
P
4C  
50  
Rev. 0.1 / Jul. 2004  
14  
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