IXFL210N30P3
Symbol
Test Conditions
Characteristic Values
ISOPLUS264 (IXFL) OUTLINE
(TJ = 25C Unless Otherwise Specified)
Min.
Typ.
Max.
gfs
VDS = 10V, ID = 60A, Note 1
VGS = 0V, VDS = 25V, f = 1MHz
Gate Input Resistance
60
100
S
Ciss
Coss
Crss
16.2
2550
42
nF
pF
pF
RGi
1.0
46
td(on)
ns
Resistive Switching Times
VGS = 10V, VDS = 0.5 • VDSS, ID = 0.5 • IDSS
RG = 1 (External)
tr
25
94
ns
ns
td(off)
1
= Gate
2,4 = Drain
= Source
tf
13
ns
3
Qg(on)
Qgs
268
80
nC
nC
nC
VGS = 10V, VDS = 0.5 • VDSS, ID = 0.5 • IDSS
Qgd
72
RthJC
RthCS
0.24C/W
C/W
0.15
Source-Drain Diode
Symbol
Test Conditions
Characteristic Values
(TJ = 25C Unless Otherwise Specified)
Min.
Typ.
Max.
210
840
1.5
IS
VGS = 0V
A
A
V
ISM
VSD
Repetitive, Pulse Width Limited by TJM
IF = 100A, VGS = 0V, Note 1
trr
QRM
IRM
250 ns
C
IF = 105A, -di/dt = 100A/s
4.1
28
VR = 100V, VGS = 0V
A
Notes:
1. Pulse test, t 300μs, duty cycle, d 2%.
2. Part must be heatsunk for high-temp IDSS measurement.
PRELIMANARY TECHNICAL INFORMATION
The product presented herein is under development. The Technical Specifications offered are
derived from a subjective evaluation of the design, based upon prior knowledge and experi-
ence, and constitute a "considered reflection" of the anticipated result. IXYS reserves the right
to change limits, test conditions, and dimensions without notice.
IXYS Reserves the Right to Change Limits, Test Conditions, and Dimensions.
IXYS MOSFETs and IGBTs are covered
by one or more of the following U.S. patents: 4,860,072 5,017,508
4,881,106 5,034,796
4,835,592 4,931,844
5,049,961
5,063,307
5,187,117
5,237,481
5,381,025
5,486,715
6,162,665
6,259,123 B1
6,306,728 B1
6,404,065 B1 6,683,344
6,534,343
6,583,505
6,727,585
6,710,405 B2 6,759,692
6,710,463
7,005,734 B2 7,157,338B2
7,063,975 B2
6,771,478 B2 7,071,537