Oven Controlled Crystal
Oscillator
OX4114A-D3-1-10.000-3.3
PHASE NOISE
PARAMETER
SYMBOL
CONDITION
VALUE
UNIT
Typ. /
Nom.*
Min.
Max.
@1 Hz Offset
@10 Hz Offset
@100 Hz Offset
@1 kHz Offset
@10 kHz Offset
@100 kHz Offset
-70
-95
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
£ (f)
£ (f)
£ (f)
£ (f)
£ (f)
£ (f)
-122
-135
-145
-150
CMOS OUTPUT CHARACTERISTICS
PARAMETER
SYMBOL
CONDITION
Min.
VALUE
UNIT
Typ.
2.4/0.4
45/55
Max.
Output Levels
Duty Cycle
Rise/Fall Time
Load
VOH/VOL VCC = 3.3V, load = 15pF
V
%
DC
load = 15pF
tr/tf
10% ~ 90% Vout
5
ns
pF
15
±5%
ENVIRONMENTAL MECHANICAL CONDITIONS
Storage temperature range
-55°C to +105°C
The test shall be carried out as the provisions of the IEC60028-2-32 test Ed.
10cm height, 3 times on hard board with thickness of 3cm
Drop Test
Device are bumped to three mutually perpendicular axes at peak acceleration of 400m/s2, each
4000±10times, 6ms pulse duration time
Frequency range: 1Hz-4Hz-100Hz-200Hz
Acceleration: 0.0001g2/Hz-0.01g2/Hz-0.01g2/Hz-0.001g2/Hz
Grms=1.15g
Bumping Test
Vibration Test
Sweep time: 30 minutes (perpendicular axes each sweep time)
100g, 6mS duration, 1/2 sine wave, 3 shocks each direction along 3 mutually perpendicular planes.
Mechanical Shock
Thermal shock
0.5h@‐40℃,0.5h@+85℃,Note: the changing time < 30 seconds, cycling for 100 times
RALTRON ELECTRONICS ▪ 10400 N.W. 33r d St ▪ Miami, Florida 33172 ▪ U.S.A.
Tel: +1-305-593-6033 ▪ Fax: +1-305-594-3973 ▪ email: sales@raltron.com ▪ web site: http://www.raltron.com