IXTF1N450
Symbol
Test Conditions
Characteristic Values
ISOPLUS i4-PakTM (HV) Outline
(TJ = 25°C, Unless Otherwise Specified)
Min.
Typ.
Max.
gfs
VDS = 50V, ID = 200mA, Note 1
VGS = 0V, VDS = 25V, f = 1MHz
Gate Input Resistance
0.28
0.46
S
Ciss
Coss
Crss
1730
78
pF
pF
pF
28
RGi
21
Ω
td(on)
tr
td(off)
tf
34
60
ns
ns
ns
ns
Resistive Switching Times
VGS = 10V, VDS = 500V, ID = 0.5A
RG = 10Ω (External)
58
127
Pin 1 = Gate
Pin 2 = Soure
Pin 3 = Drain
Pin 4 = Isolated
Qg(on)
Qgs
40
10
20
nC
nC
nC
VGS = 10V, VDS = 1kV, ID = 0.5A
Qgd
RthJC
RthCS
0.77 °C/W
°C/W
0.15
Source-Drain Diode
Symbol
Test Conditions
Characteristic Values
(TJ = 25°C, Unless Otherwise Specified)
Min.
Typ.
Max.
IS
VGS = 0V
1
A
A
ISM
VSD
trr
Repetitive, Pulse Width Limited by TJM
IF = 1A, VGS = 0V, Note 1
IF = 1A, -di/dt = 50A/μs, VR = 100V
5
2.0
V
1.75
μs
Notes: 1. Pulse test, t ≤ 300μs, duty cycle, d ≤ 2%.
2. Part must be heatsunk for high-temp IDSS measurement.
PRELIMINARY TECHNICAL INFORMATION
The product presented herein is under development. The Technical Specifications offered are derived
from data gathered during objective characterizations of preliminary engineering lots; but also may yet
contain some information supplied during a pre-production design evaluation. IXYS reserves the right
to change limits, test conditions, and dimensions without notice.
IXYS Reserves the Right to Change Limits, Test Conditions, and Dimensions.
IXYS MOSFETs and IGBTs are covered
by one or moreof the following U.S. patents: 4,860,072 5,017,508
4,881,106 5,034,796
4,835,592 4,931,844
5,049,961
5,063,307
5,187,117
5,237,481
5,381,025
5,486,715
6,162,665
6,259,123 B1
6,306,728 B1
6,404,065 B1 6,683,344
6,534,343
6,583,505
6,727,585
6,710,405 B2 6,759,692
6,710,463
7,005,734 B2 7,157,338B2
7,063,975 B2
6,771,478 B2 7,071,537