IXTT16N10D2
IXTH16N10D2
Symbol
Test Conditions
Characteristic Values
TO-268 Outline
(TJ = 25C, Unless Otherwise Specified)
Min.
Typ.
Max.
gfs
VDS = 20V, ID = 8A, Note 1
7
11
S
Ciss
Coss
Crss
5700
1980
940
pF
pF
pF
VGS = -10V, VDS = 25V, f = 1MHz
td(on)
tr
td(off)
tf
45
43
ns
ns
ns
ns
Resistive Switching Times
V
GS = + 5V, VDS = 50V, ID = 8A
340
70
Terminals: 1 - Gate
3 - Source
2,4 - Drain
RG = 3.3 (External)
Qg(on)
Qgs
225
22
nC
nC
nC
VGS = + 5V, VDS = 50V, ID = 8A
Qgd
126
RthJC
RthCS
0.18C/W
C/W
TO-247
0.21
Safe-Operating-Area Specification
Characteristic Values
Min. Typ. Max.
Symbol
SOA
Test Conditions
VDS = 100V, ID = 5.6A, TC = 75C, tp = 5s
556
W
TO-247 Outline
D
A
A
0P
+
B
O 0K M D B M
E
A2
A2
Q
Source-Drain Diode
S
D2
+
+
4
R
D1
D
0P1
Symbol
Test Conditions
Characteristic Values
1
2
3
(TJ = 25C, Unless Otherwise Specified)
Min.
Typ.
Max.
ixys option
C
L1
VSD
IF = 16A, VGS = -10V, Note 1
0.80
1.30
V
E1
L
trr
IRM
QRM
205
8.50
0.88
ns
A
μC
IF = 8A, -di/dt = 100A/s
VR = 100V, VGS = -10V
A1
b
b2
c
b4
PINS: 1 - Gate
e
+
O
2, 4 - Drain
3 - Source
J
M
C
A M
Note 1. Pulse test, t 300s, duty cycle, d 2%.
IXYS Reserves the Right to Change Limits, Test Conditions, and Dimensions.
IXYS MOSFETs and IGBTs are covered
by one or more of the following U.S. patents: 4,860,072 5,017,508
4,881,106 5,034,796
4,835,592 4,931,844
5,049,961
5,063,307
5,187,117
5,237,481
5,381,025
5,486,715
6,162,665
6,259,123 B1
6,306,728 B1
6,404,065 B1 6,683,344
6,534,343
6,583,505
6,727,585
6,710,405 B2 6,759,692
6,710,463
7,005,734 B2 7,157,338B2
7,063,975 B2
6,771,478 B2 7,071,537