IXTP270N04T4
IXTH270N04T4
Symbol
Test Conditions
Characteristic Values
Min. Typ. Max.
(TJ = 25C, Unless Otherwise Specified)
gfs
VDS = 10V, ID = 60A, Note 1
Gate Input Resistance
90
150
1.4
S
RGi
Ciss
Coss
Crss
9140
1450
980
pF
pF
pF
VGS = 0V, VDS = 25V, f = 1MHz
td(on)
tr
td(off)
tf
18
28
72
23
ns
ns
ns
ns
Resistive Switching Times
VGS = 10V, VDS = 0.5 • VDSS, ID = 135A
RG = 2 (External)
Qg(on)
Qgs
182
45
nC
nC
nC
VGS = 10V, VDS = 0.5 • VDSS, ID = 0.5 • ID25
Qgd
67
RthJC
RthCS
0.40 C/W
C/W
TO-220
TO-247
0.50
0.21
C/W
Source-Drain Diode
Symbol
Test Conditions
Characteristic Values
(TJ = 25C, Unless Otherwise Specified)
Min. Typ.
Max.
IS
VGS = 0V
270
A
A
V
ISM
VSD
Repetitive, Pulse width limited by TJM
IF = 100A, VGS = 0V, Note 1
1080
1.4
trr
48
1.8
43
ns
A
IF = 150A, VGS = 0V
IRM
QRM
-di/dt = 100A/s
VR = 30V
nC
Notes: 1. Pulse test, t 300s, duty cycle, d 2%.
2. On through-hole packages, RDS(on) Kelvin test contact location must be 5mm
or less from the package body.
PRELIMINARY TECHNICAL INFORMATION
The product presented herein is under development. The Technical Specifications offered are
derived from a subjective evaluation of the design, based upon prior knowledge and experi-
ence, and constitute a "considered reflection" of the anticipated result. IXYS reserves the right
to change limits, test conditions, and dimensions without notice.
IXYS Reserves the Right to Change Limits, Test Conditions, and Dimensions.
IXYS MOSFETs and IGBTs are covered
by one or more of the following U.S. patents: 4,860,072 5,017,508
4,881,106 5,034,796
4,835,592 4,931,844
5,049,961
5,063,307
5,187,117
5,237,481
5,381,025
5,486,715
6,162,665
6,259,123 B1
6,306,728 B1
6,404,065 B1 6,683,344
6,534,343
6,583,505
6,727,585
6,710,405 B2 6,759,692
6,710,463
7,005,734 B2 7,157,338B2
7,063,975 B2
6,771,478 B2 7,071,537