IXGF32N170
ISOPLUS i4-PakTM (HV) (IXGF) Outline
Symbol
Test Conditions
Characteristic Values
(TJ = 25°C, Unless Otherwise Specified)
Min.
Typ.
Max.
gfs
IC = 32A, VCE = 10V, Note 1
20
30
S
Cies
Coes
Cres
4290
167
47
pF
pF
pF
VCE = 25V, VGE = 0V, f = 1MHz
Qg
146
28
nC
nC
nC
Qge
Qgc
IC = 32A, VGE = 15V, VCE = 0.5 • VCES
52
td(on)
tri
45
38
ns
ns
Inductive load, TJ = 25°C
IC = 32A, VGE = 15V
td(off)
270
500 ns
VCE = 0.6 • VCES, RG = 2.7Ω
tfi
Eoff
250
10.6
500 ns
20 mJ
td(on)
tri
48
42
ns
ns
Inductive load, TJ = 125°C
IC = 32A, VGE = 15V
Eoff
6.0
mJ
ns
td(off)
360
VCE = 0.6 • VCES, RG = 2.7Ω
tfi
560
ns
Eoff
13.5
mJ
RthJC
RthCS
RthJA
0.62 °C/W
°C/W
0.15
30
°C/W
Notes: 1. Pulse test, t < 300μs; duty cycle, d < 2%.
2. Device must be heatsunk for high temperature leakage current
measurements to avoid thermal runaway.
IXYS Reserves the Right to Change Limits, Test Conditions, and Dimensions.
IXYS MOSFETs and IGBTs are covered
by one or more of the following U.S. patents: 4,850,072 5,017,508
4,881,106 5,034,796
4,835,592 4,931,844
5,049,961
5,063,307
5,187,117
5,237,481
5,381,025
5,486,715
6,162,665
6,259,123 B1
6,306,728 B1
6,404,065 B1 6,683,344
6,534,343
6,583,505
6,727,585
6,710,405 B2 6,759,692
6,710,463
7,005,734 B2 7,157,338B2
7,063,975 B2
6,771,478 B2 7,071,537