IXGH/IXGT 16N170A
IXGH/IXGT 16N170AH1
Symbol
gfs
TestConditions
Characteristic Values
TO-247 AD Outline
(TJ = 25°C unless otherwise specified)
min. typ.
max.
IC = IC25; VCE = 10 V
Note 2
7
13
S
∅ P
Cies
1620
83
pF
Coes
VCE = 25 V, VGE = 0 V, f = 1 MHz
16N170A
pF
pF
16N170AH1 110
Cres
31
pF
Qg
83
10
31
nC
nC
nC
e
Qge
Qgc
IC = IC90, VGE = 15 V, VCE = 0.5 VCES
Dim.
Millimeter
Min. Max.
Inches
Min. Max.
A
A1
A2
4.7
2.2
2.2
5.3
2.54
2.6
.185 .209
.087 .102
.059 .098
td(on)
tri
td(off)
tfi
36
57
ns
ns
Inductive load, TJ = 25°C
IC = IC25, VGE = 15 V, RG = 10 Ω
VCE = 0.5 VCES ,Note 3
b
b1
b2
1.0
1.65
2.87
1.4
2.13
3.12
.040 .055
.065 .084
.113 .123
160
70
300 ns
150 ns
1.5 mJ
C
D
E
.4
.8
.016 .031
.819 .845
.610 .640
Eoff
0.85
20.80 21.46
15.75 16.26
td(on)
tri
38
59
ns
ns
e
L
L1
5.20
19.81 20.32
4.50
5.72 0.205 0.225
Inductive load, TJ = 125°C
IC = IC25, VGE = 15 V, RG = 10 Ω
VCE = 0.5 VCES ,Note 3
.780 .800
.177
∅P 3.55
Q
3.65
.140 .144
Eon
16N170A
1.5
mJ
mJ
5.89
6.40 0.232 0.252
16N170AH1 2.5
R
S
4.32
6.15 BSC
5.49
.170 .216
242 BSC
td(off)
tfi
175
155
2.0
ns
ns
Eoff
mJ
TO-268 Outline
RthJC
RthCK
0.65 K/W
K/W
(TO-247)
0.25
ReverseDiode(FRED)
Characteristic Values
Symbol
TestConditions
min. typ.
max.
(TJ = 25°C unless otherwise specified)
VF
IF = 20A, VGE = 0 V, Note 2
2.5
2.9
V
V
TJ = 125°C
2.5
Dim.
Millimeter
Min. Max.
Inches
Min. Max.
trr
IF = 20A, VGE = 0 V, -diF/dt = 450 A/μs
230
400
23
ns
ns
A
A
A1
A2
4.9
2.7
.02
5.1
2.9
.25
.193 .201
.106 .114
.001 .010
VR = 1200 V
TJ = 125°C
IRM
b
b2
C
1.15
1.9
.4
1.45
2.1
.65
.045 .057
TJ = 125°C
27
A
.75
.83
.016 .026
RthJC
0.9 K/W
D
E
E1
13.80 14.00
15.85 16.05
.543 .551
.624 .632
.524 .535
13.3
13.6
e
H
L
5.45 BSC
18.70 19.10
.215 BSC
.736 .752
.094 .106
Notes:1. Device must be heatsunk for high temperature leakage current
measurements to avoid thermal runaway.
2.40
2.70
2. Pulse test, t ≤ 300 μs, duty cycle ≤ 2 %
L1
1.20
1.40
.047 .055
3. Switching times may increase for VCE (Clamp) > 0.8 • VCES, higher TJ or
increased RG.
L2
L3
L4
1.00
0.25 BSC
3.80 4.10
1.15
.039 .045
.010 BSC
.150 .161
IXYS reserves the right to change limits, test conditions, and dimensions.
IXYSMOSFETs andIGBTsarecovered by
oneormoreofthefollowingU.S.patents:
4,835,592
4,850,072
4,881,106
4,931,844
5,017,508
5,034,796
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5,063,307
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5,237,481
5,381,025
5,486,715
6,162,665
6,259,123B1
6,306,728 B1
6,404,065B1
6,534,343
6,583,505
6,683,344
6,710,405B2
6,710,463
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6,759,692
6771478B2