IXGH 50N90B2D1 IXGK 50N90B2D1
IXGX 50N90B2D1
Symbol
TestConditions
Characteristic Values
min. typ. max.
(TJ = 25°C unless otherwise specified)
gfs
IC
= IC110 ; VCE = 10 V, Note 1
25
40
S
Cies
Coes
Cres
2500
205
75
pF
pF
pF
VCE = 25 V, VGE = 0 V, f = 1 MHz
Qg
135
23
nC
nC
nC
Qge
Qgc
IC = IC110 , VGE = 15 V, VCE = 0.5 VCES
50
td(on)
tri
td(off)
tfi
20
28
ns
ns
Inductiveload
IC = IC110, VGE = 15 V
350
200
4.7
500 ns
ns
VCE = 720 V, RG = Roff = 5 Ω
Eoff
7.5 mJ
td(on)
tri
20
28
ns
ns
Inductive load, TJ = 125°C
IC = IC110, VGE = 15 V
Eon
td(off)
tfi
1.5
400
420
8.7
mJ
ns
VCE = 720 V, RG = Roff = 5 Ω
ns
Eoff
mJ
RthJC
RthCH
0.31 K/W
K/W
0.21
Diode
Symbol
IF25
Conditions
Maximum Ratings
30
TC = 115°C
A
Symbol
Conditions
Characteristic Values
(TJ = 25°C unless otherwise specified)
min.
typ. max.
VF
IF = 30 A; Note 1
2.5 2.75
1.8
V
V
TVJ = 150°C
IRM
trr
IF = 10 A; diF/dt = -100 A/μs; TVJ = 100°C
VR = 100 V; VGE = 0 V
5.5 11.5
200
A
ns
RthJC
RthCH
0.9 K/W
K/W
with heat transfer paste
0.25
Note 1: Pulse test, t ≤ 300 μs, duty cycle ≤ 2 %
IXYS reserves the right to change limits, test conditions, and dimensions.
IXYSMOSFETsandIGBTsarecoveredby
oneormoreofthefollowingU.S.patents:
4,835,592
4,850,072
4,881,106
4,931,844
5,017,508
5,034,796
5,049,961
5,063,307
5,187,117
5,237,481
5,381,025
5,486,715
6,162,665
6,259,123B1
6,306,728 B1
6,404,065B1
6,534,343
6,583,505
6,683,344
6,710,405B2
6,710,463
6,727,585
6,759,692
6771478B2