IXGF30N400
ISOPLUS i4-PakTM (HV) Outline
Symbol
Test Conditions
Characteristic Values
(TJ = 25°C, Unless Otherwise Specified)
Min.
Typ.
Max.
gfs
IC = 30A, VCE = 10V, Note 1
VGE = 15V, VCE = 20V, Note 1
14
23
S
A
IC(ON)
360
Cies
Coes
Cres
3040
95
pF
pF
pF
VCE = 25V, VGE = 0V, f = 1MHz
IC = 30A, VGE = 15V, VCE = 600V
30
Qg
135
22
nC
nC
nC
Qge
Qgc
50
td(on)
tr
td(off)
tf
55
146
210
514
ns
ns
ns
ns
Pin 1 = Gate
Resistive Switching Times
IC = 30A, VGE = 15V,
Pin 2 = Emitter
Pin 3 = Collector
Tab 4 = Isolated
VCE = 1250V, RG = 2Ω
RthJC
RthCS
RthJA
0.78 °C/W
°C/W
0.15
30
°C/W
Notes:
1. Pulse test, t < 300μs, duty cycle, d < 2%.
2. Device must be heatsunk for high-temperature leakage current
measurements to avoid thermal runaway.
IXYS Reserves the Right to Change Limits, Test Conditions, and Dimensions.
IXYS MOSFETs and IGBTs are covered
by one or more of the following U.S. patents: 4,850,072 5,017,508
4,881,106 5,034,796
4,835,592 4,931,844
5,049,961
5,063,307
5,187,117
5,237,481
5,381,025
5,486,715
6,162,665
6,259,123 B1
6,306,728 B1
6,404,065 B1 6,683,344
6,727,585
7,005,734 B2 7,157,338B2
7,063,975 B2
6,534,343
6,583,505
6,710,405 B2 6,759,692
6,710,463
6,771,478 B2 7,071,537