IXGR 32N60CD1
Symbol
gfs
TestConditions
CharacteristicValues
(TJ = 25°C, unless otherwise specified)
min. typ. max.
ISOPLUS 247 (IXGR) OUTLINE
IC = IT; VCE = 10 V,
25
S
Pulse test, t £ 300 ms, duty cycle £ 2 %
Cies
Coes
Cres
2700
240
50
pF
pF
pF
VCE = 25 V, VGE = 0 V, f = 1 MHz
Qg
110
22
nC
nC
nC
Qge
Qgc
IC = IT, VGE = 15 V, VCE = 0.5 VCES
40
1 Gate, 2 Drain (Collector)
3 Source (Emitter)
4 no connection
Inductive load, TJ = 25°C
td(on)
tri
td(off)
tfi
25
20
ns
ns
ns
ns
mJ
IC = IT, VGE = 15 V, L = 100 mH,
VCE = 0.8 VCES, RG = Roff = 4.7 W
85
Remarks: Switching times may
increase for VCE (Clamp) > 0.8 • VCES
higher TJ or increased RG
55
Dim.
Millimeter
Inches
,
Min. Max. Min. Max.
Eoff
0.32
A
A1
A2
4.83
2.29
1.91
5.21
2.54
2.16
.190 .205
.090 .100
.075 .085
td(on)
tri
25
25
ns
ns
Inductive load, TJ = 125°C
IC = IT, VGE = 15 V, L = 100 mH
VCE = 0.8 VCES, RG = Roff = 4.7 W
Remarks: Switching times may
b
b1
b2
1.14
1.91
2.92
1.40
2.13
3.12
.045 .055
.075 .084
.115 .123
Eon
td(off)
tfi
1
mJ
C
D
E
0.61
0.80
20.80 21.34
15.75 16.13
.024 .031
.819 .840
.620 .635
110
100
170 ns
160 ns
increase for VCE (Clamp) > 0.8 • VCES
higher TJ or increased RG
,
e
L
L1
5.45 BSC
19.81 20.32
.215 BSC
.780 .800
.150 .170
Eoff
0.85
1.25 mJ
3.81
4.32
RthJC
RthCK
0.90 K/W
K/W
Q
R
5.59
4.32
6.20
4.83
.220 .244
.170 .190
0.15
S
T
U
13.21 13.72
15.75 16.26
1.65
.520 .540
.620 .640
.065 .080
3.03
Reverse Diode (FRED)
CharacteristicValues
(TJ = 25°C, unless otherwise specified)
Symbol
VF
TestConditions
IF = IT, VGE = 0 V, Pulse test
min. typ. max.
TJ = 150°C
TJ = 25°C
1.6
2.5
V
V
t
£ 300 ms, duty cycle d £ 2 %
IRM
trr
IF = IT, VGE = 0 V, -diF/dt = 100 A/ms
VR = 100 V
IF = 1 A; -di/dt = 100 A/ms; VR = 30 V TJ = 25°C
6
A
ns
ns
TJ = 100°C 100
25
RthJC
1.15 K/W
Note: 1. IT = 32A
IXYS MOSFETS and IGBTs are covered by one or more of the following U.S. patents:
© 2000 IXYS All rights reserved
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