IXGN72N60C3H1
Symbol
Test Conditions
Characteristic Values
SOT-227B miniBLOC
(TJ = 25°C, Unless Otherwise Specified)
Min.
Typ.
Max.
gfs
IC = 50A, VCE = 10V, Note 1
VCE = 25V, VGE = 0V, f = 1MHz
33
55
S
Cies
Coes
Cres
4780
330
pF
pF
pF
117
Qg
174
33
nC
nC
nC
Qge
Qgc
IC = 50A, VGE = 15V, VCE = 0.5 • VCES
72
td(on)
tri
27
37
ns
ns
Inductive load, TJ = 25°C
M4 screws (4x) supplied
Eon
td(off)
tfi
1.03
77
mJ
IC = 50A, VGE = 15V
130 ns
110 ns
VCE = 480V, RG = 2Ω, Note 2
55
Eoff
0.48
0.95 mJ
td(on)
tri
26
36
ns
ns
Inductive load, TJ = 125°C
IC = 50A, VGE = 15V
Eon
td(off)
tfi
1.48
120
124
0.93
mJ
ns
VCE = 480V, RG = 2Ω, Note 2
ns
Eoff
mJ
RthJC
RthCS
0.35 °C/W
°C/W
0.05
Reverse Diode (FRED)
Symbol
Test Conditions
Characteristic Values
(TJ = 25°C, Unless Otherwise Specified)
Min.
Typ.
Max.
VF
IF = 60A, VGE = 0V, Note 1
1.6
1.4
2.0
1.8
V
V
TJ = 150°C
TJ = 100°C
IRM
trr
8.3
A
IF = 60A, VGE = 0V,
-diF/dt = 200A/μs, VR = 300V
140
ns
0.42 °C/W
RthJC
Notes:
1. Pulse test, t ≤ 300μs, duty cycle, d ≤ 2%.
2. Switching times & energy losses may increase for higher VCE(Clamp), TJ or RG.
IXYS Reserves the Right to Change Limits, Test Conditions, and Dimensions.
IXYS MOSFETs and IGBTs are covered
by one or moreof the following U.S. patents: 4,850,072 5,017,508
4,881,106 5,034,796
4,835,592 4,931,844
5,049,961
5,063,307
5,187,117
5,237,481
5,381,025
5,486,715
6,162,665
6,259,123 B1
6,306,728 B1
6,404,065 B1 6,683,344
6,534,343
6,583,505
6,727,585
6,710,405 B2 6,759,692
6,710,463
7,005,734 B2 7,157,338B2
7,063,975 B2
6,771,478 B2 7,071,537