IXGH 20N120BD1
IXGT 20N120BD1
TO-247 AD Outline
Symbol
gfs
TestConditions
Characteristic Values
(TJ = 25°C, unless otherwise specified)
min. typ. max.
IC = 20A; VCE = 10 V,
Note 2.
12
18
S
Cies
Coes
Cres
1700
105
39
pF
pF
pF
VCE = 25 V, VGE = 0 V, f = 1 MHz
Qg
72
12
27
nC
nC
nC
Qge
Qgc
IC = 20A, VGE = 15 V, VCE = 0.5 VCES
td(on)
tri
25
15
ns
ns
Inductive load, TJ = 25°C
IC = 20 A; VGE = 15 V
1 = Gate
2 = Collector
3 = Emitter
Tab = Collector
VCE = 0.8 VCES; RG = Roff = 10 Ω
td(off)
150
280 ns
Note 1.
tfi
Eoff
160
2.1
320 ns
3.5 mJ
td(on)
tri
25
18
ns
ns
Inductive load, TJ = 125°C
IC = 20A; VGE = 15 V
Eon
td(off)
1.9
270
mJ
ns
VCE = 0.8 VCES; RG = Roff = 10 Ω
Note 1
tfi
Eoff
360
3.5
ns
mJ
RthJC
RthCK
0.65 K/W
K/W
TO-268 Outline
(TO-247)
0.25
ReverseDiode(FRED)
Characteristic Values
(TJ = 25°C, unless otherwise specified)
min. typ. max.
Symbol
TestConditions
VF
IF
IF = 10 A, VGE = 0 V
3.3
10
V
A
TC = 90°C
IRM
trr
IF = 10 A; -diF/dt = 400 A/µs, VR = 600 V
VGE = 0 V; TJ = 125°C
14
120
A
ns
Dim.
Millimeter
Inches
Min. Max.
Min.
Max.
A
A1
A2
4.9
2.7
.02
5.1
2.9
.25
.193 .201
.106 .114
.001 .010
trr
IF = 1 A; -diF/dt = 100 A/µs; VR = 30 V, VGE = 0 V
40
ns
RthJC
2.5 K/W
b
b2
C
1.15
1.9
.4
1.45
2.1
.65
.045 .057
.75
.83
.016 .026
D
E
E1
13.80 14.00
15.85 16.05
.543 .551
.624 .632
.524 .535
Notes: 1.
2.
Switching times may increase for VCE (Clamp) > 0.8 • VCES
higher TJ or increased RG.
Pulse test, t ≤ 300 µs, duty cycle d ≤ 2 %
,
13.3
13.6
e
H
L
5.45 BSC
18.70 19.10
.215 BSC
.736 .752
.094 .106
2.40
2.70
L1
1.20
1.40
.047 .055
L2
L3
L4
1.00
0.25 BSC
3.80 4.10
1.15
.039 .045
.010 BSC
.150 .161
IXYS reserves the right to change limits, test conditions, and dimensions.
IXYSMOSFETs andIGBTsarecovered byoneormore
ofthefollowingU.S.patents:
4,835,592 4,881,106 5,017,508 5,049,961 5,187,117 5,486,715 6,306,728B1 6,259,123B1 6,306,728B1
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