IXGR 50N60B2
IXGR 50N60B2D1
Symbol
gfs
TestConditions
Characteristic Values
(TJ = 25°C, unless otherwise specified)
Min. Typ. Max.
ISOPLUS 247 Outline
IC = 40 A; VCE = 10 V,
Note 1
40
55
S
Cies
Coes
3500
240
280
50
pF
pF
pF
pF
VCE= 25 V, VGE = 0 V, f = 1 MHz
50N60B2
50N60B2D1
Cres
Qg
140
23
nC
nC
nC
Qge
Qgc
IC = 40 A, VGE = 15 V, VCE = 0.5 VCES
44
Inductive load, TJ = 25°C
IC = 40 A, VGE = 15 V
td(on)
tri
td(off)
tfi
18
25
ns
ns
VCE = 480 V, RG = Roff = 5.0 Ω
190 300 ns
65 ns
0.55 0.85 mJ
Eoff
td(on)
tri
18
25
ns
ns
Inductive load, TJ = 125°C
IC = 40 A, VGE = 15 V
Eon
td(off)
tfi
0.9
mJ
ns
VCE = 480 V, RG = Roff = 5.0 Ω
290
140
1.55
ns
Eoff
mJ
RthJ-DCB
RthJC
RthCS
(Note 2)
(Note 3)
0.31
0.15
K/W
0.62 K/W
K/W
Reverse Diode (FRED)
Characteristic Values
(TJ = 25°C, unless otherwise specified)
min. typ. max.
Symbol
VF
TestConditions
IF = 60 A, VGE = 0 V,
Note 1
2.0
1.39
V
A
TJ = 150°C
IRM
IF = 60 A, VGE = 0 V, -diF/dt = 100 A/µ TJ = 100°C
VR = 100 V
8.3
trr
IF = 1 A; -di/dt = 200 A/ms; VR = 30 V
35
ns
0.85 K/W
RthJC
Notes 1: Pulse test, t ≤ 300 µs, duty cycle ≤ 2 %
2: RthJ-DCB is the thermal resistance junction-to-internal side of DCB substrate.
3: RthJC is the thermal resistance junction-to-external side of DCB substrate.
IXYS reserves the right to change limits, test conditions, and dimensions.
IXYSMOSFETs andIGBTsarecovered byoneormore
ofthefollowingU.S.patents:
4,850,072
4,835,592
4,931,844
4,881,106
5,034,796
5,017,508
5,063,307
5,049,961
5,237,481
5,187,117
5,381,025
5,486,715
6,404,065B1 6,162,665
6,306,728B1 6,259,123B1 6,306,728B1 6,683,344
6,534,343
6,583,505