IXGH39N60B
IXGT39N60B
IXGH39N60BD1 IXGT39N60BD1
Symbol
gfs
TestConditions
Characteristic Values
TO-247 AD Outline
(TJ = 25°C, unless otherwise specified)
min. typ. max.
IC = IC90; V = 10 V,
19
28
S
Pulse test, t C≤E 300 µs, duty cycle ≤ 2 %
P
Cies
2750
pF
Coes
VCE = 25 V, VGE = 0 V, f = 1 MHz
39N60B
200
240
pF
pF
39N60BD1
Cres
50
pF
e
QG
QGE
QGC
110
25
40
150 nC
35 nC
75 nC
Dim.
Millimeter
Inches
Min. Max.
IC = IC90, VGE = 15 V, VCE = 0.5 VCES
Min. Max.
A
A1
A2
4.7
2.2
2.2
5.3
2.54
2.6
.185 .209
.087 .102
.059 .098
Inductive load, TJ = 25°C
td(on)
tri
td(off)
tfi
25
30
250
200
4.0
ns
ns
500 ns
360 ns
6.0 mJ
b
b1
b2
1.0
1.65
2.87
1.4
2.13
3.12
.040 .055
.065 .084
.113 .123
IC = IC90, VGE = 15 V
VCE = 0.8 VCES, RG = Roff = 4.7 Ω
C
D
E
.4
.8
.016 .031
.819 .845
.610 .640
Remarks: Switching times may
increase for V (Clamp) > 0.8 • VCES
higher TJ or inCcEreased RG
20.80 21.46
15.75 16.26
,
,
Eoff
e
L
L1
5.20
5.72 0.205 0.225
19.81 20.32
4.50
.780 .800
.177
td(on)
tri
Eon
td(off)
tfi
25
30
0.3
360
350
6.0
ns
ns
mJ
ns
ns
mJ
Inductive load, TJ = 125°C
IC = IC90, VGE = 15 V
CE = 0.8 VCES, RG = Roff = 4.7 Ω
Remarks: Switching times may
increase for V (Clamp) > 0.8 • VCES
higher TJ or inCcEreased RG
P
3.55
5.89
3.65
.140 .144
Q
6.40 0.232 0.252
R
S
4.32
6.15 BSC
5.49
.170 .216
242 BSC
V
Eoff
RthJC
RthCK
0.62 K/W
K/W
0.25
ReverseDiode(FRED)
Characteristic Values
(TJ = 25°C, unless otherwise specified)
Symbol
VF
TestConditions
min. typ. max.
I
= I , V = 0 V, Pulse test
T =150°C
TJJ = 25°C
1.6
2.5
V
V
tF≤ 30C090µs,GdEuty cycle d ≤ 2 %
IRM
trr
IF = IC90, V = 0 V, -diF/dt = 100 A/µs
IFR = 1 A; -di/dt = 100 A/µs; VR = 30 V TJJ = 25°C
6
A
ns
ns
V = 100 VGE
T = 100°C 100
25
RthJC
0.9 K/W
IXYS reserves the right to change limits, test conditions, and dimensions.
IXYSMOSFETSandIGBTsarecoveredbyoneormoreofthefollowingU.S.patents:
4,835,592
4,850,072
4,881,106
4,931,844
5,017,508
5,034,796
5,049,961
5,063,307
5,187,117
5,237,481
5,486,715 6,306,728B1
5,381,025